• DocumentCode
    3180201
  • Title

    Effect of film thickness on structural and optical properties of TiO2 thin films

  • Author

    Malliga, P. ; Pandiarajan, J. ; Prithivikumaran, N. ; Neyvasagam, K.

  • Author_Institution
    Dept. of Phys., V.V. Vanniaperumal Coll. for Women, Virudhunagar, India
  • fYear
    2013
  • fDate
    24-26 July 2013
  • Firstpage
    488
  • Lastpage
    491
  • Abstract
    Titanium Dioxide (TiO2) thin films have been prepared from solution of TTIP (Titanium Tetra Isopropoxide), acetic acid and ethanol on glass substrates by sol - gel dip coating technique. The films coated for different coating cycles were annealed at a temperature of 450°C for one hour. The annealed films were characterized by X - Ray diffraction (XRD) method, UV - Visible and Photoluminescence (PL) spectroscopy, Field Effect Scanning Electron Microscopy (FESEM) and Energy Dispersive X - Ray Analysis (EDAX). From XRD analysis, the crystallite size was found to increase from 19.4 nm to 71.3 nm and the phase changes from anatase to rutile with increase in the number of coating cycles. The TiO2 thin films have high transparency in the visible range.The transmittance and the optical band gap found to reduce with increase in number of coating cycles. The PL spectra of TiO2films have two peaks at 485 nm and 530 nm and intensity increases with increase in coating cycles. Surface morphology from FESEM images reveal that the films are becoming denser and roughness increases with increase in the number of coating cycles. These results suggest that the nanocrystalline TiO2 thin films are attractive material for photo catalytic applications.
  • Keywords
    X-ray chemical analysis; X-ray diffraction; annealing; crystallites; dip coating; energy gap; field emission electron microscopy; nanofabrication; nanostructured materials; optical constants; photoluminescence; scanning electron microscopy; semiconductor growth; semiconductor thin films; sol-gel processing; solid-state phase transformations; surface morphology; surface roughness; transparency; ultraviolet spectra; visible spectra; EDAX; FESEM; SiO2; TiO2; X-ray diffraction; XRD; acetic acid; anatase-rutile phase change; annealing; coating cycles; crystallite size; energy dispersive X-ray analysis; ethanol; field emission scanning electron microscopy; film thickness effect; glass substrates; nanocrystalline thin films; optical band gap; optical properties; photocatalytic applications; photoluminescence spectroscopy; roughness; size 19.4 nm to 71.3 nm; sol-gel dip coating; structural properties; surface morphology; temperature 450 degC; time 1 h; titanium dioxide thin films; titanium tetra isopropoxide solution; transmittance; transparency; ultraviolet-visible spectroscopy; Coatings; Crystals; Integrated optics; Optical films; Photoluminescence; System-on-chip; FESEMand EDAX; PL; Sol - Gel Process; TiO2 thin film; UV-Visible; XRD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Nanomaterials and Emerging Engineering Technologies (ICANMEET), 2013 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4799-1377-0
  • Type

    conf

  • DOI
    10.1109/ICANMEET.2013.6609344
  • Filename
    6609344