Using industry-grade test equipment in a digital test and product engineering lab course

Author

Miller, Christopher ; Hudson, Tina A. ; Sipes, Shannon

Author_Institution

Dept. of Electr. & Comput. Eng., Rose-Hulman Inst. of Technol., Terre Haute, IN, USA

fYear

2015

fDate

20-21 May 2015

Firstpage

13

Lastpage

16

Abstract

This paper presents a new digital test and product engineering course targeted to undergraduate seniors and master´s-level graduate students. Through industrial guided labs, students were able to gain hands-on experience using an industry-grade automatic tester (ATE). Students indicated that the course provided an integration of many of the concepts from their digital core courses, and contributed to the development of skills essential to careers in test engineering or elsewhere.

Keywords

automatic test equipment; educational courses; engineering education; digital core courses; digital testing; industry-grade automatic test equipment; product engineering lab course; test engineering; Circuit faults; Industries; Microcontrollers; Programming; Random access memory; Testing; Timing; critical thinking skills; digital systems; embedded systems testing; hands-on learning; labs; test engineering;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronics Systems Education (MSE), 2015 IEEE International Conference on

Conference_Location

Pittsburgh, PA

Print_ISBN

978-1-4799-9913-2

Type

conf

DOI

10.1109/MSE.2015.7160006

Filename

7160006