• DocumentCode
    3183082
  • Title

    Tensile Fracture Behavior of Sn-3.0Ag-0.5Cu Solder Joints on Copper

  • Author

    Guo-Kui, Ju ; Xi-Cheng, Wei ; Peng, Sun ; Liu, Johan

  • Author_Institution
    Minist. of Educ. & Sino-Swedish Microsyst. Integration Technol. (SMIT) Centre, Shanghai Univ., Shanghai
  • fYear
    2007
  • fDate
    26-28 June 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Microstructural features and tensile properties of Sn-3.0Ag-0.5Cu solder joints on copper with various aging time at 150degC were examined. The solder inner and solder/Cu interface were analyzed by SEM to identify the fracture location, morphology and compositions. The study has showed, the tensile fracture strength of the solder joints decreases with the increased aging time, and the crack initiates mostly at the interfaces between the solder and IMC layer or/and IMC and IMC layer. The morphology of fracture surface changes from dimple-like to cleavage-like surfaces. The needle-like or block-like interfacial IMCs form at the interface of Cu/solder and grow into the solder matrix. Otherwise, the Kirkendall voids can be observed in the multilayer structure close to the copper substrate. These voids have probably a detrimental effect on the tensile fracture behavior.
  • Keywords
    copper; copper alloys; fracture toughness testing; multilayers; scanning electron microscopy; silver alloys; solders; surface cracks; tensile testing; tin alloys; voids (solid); IMC layer; Kirkendall voids; SEM; SnAgCu-Cu; copper substrate; fracture location; fracture morphology; microstructural features; multilayer structure; solder joints; temperature 150 C; tensile fracture behavior; tensile fracture strength; Aging; Copper; Fatigue; Soldering; Surface cracks; Surface morphology; Temperature; Tensile stress; Testing; Thermomechanical processes; Cu/Sn-3.0Ag-0.5Cu/Cu joint; IMC; Kirkendall void; tensile fracture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density packaging and Microsystem Integration, 2007. HDP '07. International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-1252-8
  • Electronic_ISBN
    1-4244-1253-6
  • Type

    conf

  • DOI
    10.1109/HDP.2007.4283617
  • Filename
    4283617