• DocumentCode
    318404
  • Title

    A case study of the test development for the 2nd generation ColdFireR microprocessors

  • Author

    Amason, Dale ; Crouch, Alfred L. ; Eisele, Renny ; Giles, Grady ; Mateja, Michael

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    424
  • Lastpage
    432
  • Abstract
    A case study of the development of the design for test methodology of the second generation of the ColdFireR Microprocessor Family is described from the viewpoint of goals, initial strategy and implementation. Methodology includes at-speed scan path design, path delay testing, IDDQ and direct access test modes for embedded memories. Scan tests are applied with timing identical to that specified for peak performance normal operation
  • Keywords
    automatic test equipment; automatic testing; computer testing; delays; design for testability; electric current measurement; integrated circuit testing; integrated memory circuits; logic testing; microprocessor chips; ColdFire microprocessor; IDDQ test; at-speed scan path design; direct access test; embedded memories; path delay testing; test development; timing; Automatic testing; Automation; Computer aided software engineering; Costs; Design methodology; Guidelines; Logic design; Logic testing; Microprocessors; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639645
  • Filename
    639645
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=318404