• DocumentCode
    318405
  • Title

    Logic diagnosis-diversion or necessity?

  • Author

    Fuch, W.K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    433
  • Abstract
    Failure diagnosis is resource intensive, frustrating, and often impossible. However, it is also critical and necessary for aggressive designs and manufacturing processes. Research in this area is making rapid progress, but the challenges are also rapidly growing in magnitude and importance
  • Keywords
    automatic testing; circuit CAD; design for testability; fault diagnosis; logic CAD; logic testing; production testing; ATPG; CAD; DFT; IC diagnosis; failure diagnosis; logic diagnosis; memory diagnosis; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Failure analysis; Fault detection; Fault diagnosis; Logic; Manufacturing processes; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639646
  • Filename
    639646
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=318405