DocumentCode
318410
Title
P1149.4-problem or solution for mixed-signal IC design?
Author
Sunter, Stephen K.
Author_Institution
LogicVision Inc., Ottawa, Ont., Canada
fYear
1997
fDate
1-6 Nov 1997
Firstpage
625
Abstract
The issue of whether the proposed P1149.4 Standard for a Mixed-Signal Test Bus will be a net benefit to board level design and test seems to be more or less settled: for the extremely dense circuit boards which will be commonplace in five years, and in today´s multi-chip modules, P1149.4 offers a solution where no other exists. P1149.4 was aimed at solving test issues for these mixed-signal boards. For boards which do not have test access issues, P1149.4 may not be worth its costs. So the key question about the proposed P1149.4 Standard is whether it will be a net benefit for IC designers, without considering the system-level benefits
Keywords
design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; multichip modules; standards; IC design; P1149.4 standard; board level design; dense circuit boards; mixed-signal test bus; multi-chip modules; test access issues; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639671
Filename
639671
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