Sources, paths and traps of conducted EMI in switch mode circuits

Author

Ferreira, J.A. ; Willcock, P.R. ; Holm, S.R.

Author_Institution

Energy Lab., Rand Afrikaans Univ., Johannesburg, South Africa

Volume

2

fYear

1997

fDate

5-9 Oct 1997

Firstpage

1584

Abstract

Formal circuit analysis of the generation and propagation of conducted electromagnetic noise is very complicated due to the complicated nature of circuit parasitics. Not only are the parasitics caused by complicated three dimensional shapes, but the high frequency characteristics of components and materials are normally unknown to the designer. A structured approach to conducted EMI is presented whereby functional elements are defined, namely sources, paths and traps of EMI. A systematic testing method to trace the generation and propagation of conducted noise in switch mode converters is proposed and illustrated on an experimental boost converter. Lastly, some results are presented on the reduction of the noise source by employing soft switching

Keywords

DC-DC power convertors; electromagnetic interference; interference suppression; switched mode power supplies; boost converter; circuit analysis; conducted EMI; conducted electromagnetic noise generation; conducted electromagnetic noise propagation; functional elements; high frequency characteristics; noise source reduction; soft switching; switch mode circuits; switch mode converters; systematic testing method; Circuit analysis; Circuit noise; Electromagnetic interference; Electromagnetic propagation; Noise generators; Noise shaping; Shape; Switches; Switching circuits; Switching converters;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE

Conference_Location

New Orleans, LA

ISSN

0197-2618

Print_ISBN

0-7803-4067-1

Type

conf

DOI

10.1109/IAS.1997.629063

Filename

629063