• DocumentCode
    3188533
  • Title

    Parameter extraction and calorimetric validation for a silicon carbide JFET PSpice model

  • Author

    Kumar Singh, Santosh ; Guedon, Florent ; McMahon, Richard ; Weier, Sven

  • Author_Institution
    Electronics Power and Energy Conversion group, Electrical Engineering Division, CAPE, University of Cambridge, UK
  • fYear
    2010
  • fDate
    19-21 April 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper focuses on the PSpice model of SiC-JFET element inside a SiCED cascode device. The device model parameters are extracted from the I–V and C-V characterization curves. In order to validate the model, an inductive test rig circuit is designed and tested. The switching loss is estimated both using oscilloscope and calorimeter. These results are found to be in good agreement with the simulated results.
  • Keywords
    Cascode; JFET; Silicon carbide (SiC); calorimeter; threshold voltage;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Power Electronics, Machines and Drives (PEMD 2010), 5th IET International Conference on
  • Conference_Location
    Brighton, UK
  • Type

    conf

  • DOI
    10.1049/cp.2010.0121
  • Filename
    5522515
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3188533