Evaluation of signature-based testing of RF/analog circuits

Author

Zjajo, Amir ; De Gyvez, Jose Pineda

Author_Institution

Philips Res. Labs., Eindhoven, Netherlands

fYear

2005

fDate

22-25 May 2005

Firstpage

62

Lastpage

67

Abstract

Due to its low cost, low test time and reduced test complexity, structural testing is preferred to functional whenever possible. The study presented in this paper indicates that the two low-frequency structural test methods considered, power supply current monitoring and the power supply ramping technique, provide a valuable supplement/alternative when one of the functional tests (gain, noise figure and total harmonic distortion) in the test set can be complemented or substituted by structural test and add to or maintain no loss of fault coverage.

Keywords

analogue integrated circuits; fault diagnosis; integrated circuit testing; power supply circuits; radiofrequency integrated circuits; RF integrated circuits; analog integrated circuits; fault coverage; functional testing; integrated circuit testing; low-frequency structural test methods; power supply current monitoring; power supply ramping; signature-based testing; structural testing; Analog circuits; Circuit faults; Circuit testing; Cost function; Current supplies; Monitoring; Noise figure; Power supplies; Radio frequency; Total harmonic distortion;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2005. European

Print_ISBN

0-7695-2341-2

Type

conf

DOI

10.1109/ETS.2005.22

Filename

1430010