• DocumentCode
    3188866
  • Title

    Modeling of non-ideal switch-capacitor integrator and its effect on baseband sigma-delta modulator stability and output dynamic range

  • Author

    Torkzadeh, Pooya ; Tajalli, Armin ; Atarodi, M.

  • Author_Institution
    Dept. of EE, Sharif Univ., Tehran, Iran
  • fYear
    2005
  • fDate
    13-15 Dec. 2005
  • Abstract
    As the sigma-delta modulator integrators would be implemented by switch-capacitor circuits typically, integrator non-idealities such as the low amount of overall integrator gain, the effect of finite gain of op-amp which causes the integrator voltage leakage and degrading the overall integrator gain, and the capacitance voltage dependency, would result in debilitating the output dynamic range and endanger the modulator stability. In this paper, the non ideal integrator transfer function based on mentioned drawbacks would be calculated elaborately and by followings, the modulator output dynamic range and stability would be verified based on calculated non-idealities effects. The results are obtained using the general model for the quantizer and modulator and are validated by performing direct simulations.
  • Keywords
    integrating circuits; operational amplifiers; sigma-delta modulation; switched capacitor networks; baseband sigma-delta modulator; capacitance voltage dependency; integrator voltage leakage; modulator stability; nonideal integrator transfer function; nonideal switch capacitor integrator; nonideal switch-capacitor integrator; op-amp finite gain; output dynamic range; quantizer; switch-capacitor circuits; Baseband; Capacitance-voltage characteristics; Circuit stability; Degradation; Delta-sigma modulation; Dynamic range; Operational amplifiers; Switching circuits; Transfer functions; Voltage; Baseband Sigma-Delta Modulator; Non-Ideal Switch Capacitor Integrator; Output Dynamic Range and Modulator Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2005. ICM 2005. The 17th International Conference on
  • Print_ISBN
    0-7803-9262-0
  • Type

    conf

  • DOI
    10.1109/ICM.2005.1590045
  • Filename
    1590045