DocumentCode
3191430
Title
Multiple scattering from radiation distributions of individual rough surface scatterers
Author
Bahar, E. ; El-Shenawee, M.
Author_Institution
Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
fYear
1992
fDate
18-25 June 1992
Firstpage
1708
Abstract
The full-wave approach is used to compute the single and the double scattered intensities from random rough surfaces. The surface is assumed to consist of random distributions of individual rough surface scatterers with different mean square height, slope, and mean depth. The results show that the double backscattered intensity is significant for normal incidence if the mean square slope is large and the scatterer is highly conducting.<>
Keywords
backscatter; electromagnetic wave scattering; conducting scatterer; double backscattered intensity; double scattered intensities; full wave method; mean depth; mean square height; multiple scattering; normal incidence; radiation distributions; random rough surfaces; rough surface scatterers; single scattered intensity; slope; Fluctuations; Probability density function; Random variables; Rough surfaces; Scattering; Surface roughness; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-0730-5
Type
conf
DOI
10.1109/APS.1992.221527
Filename
221527
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