Evaluation of power gating structures focusing on power supply noise with measurement and simulation

This paper investigates the impact of power gating structure on power supply noise using 65nm test chip measurement and simulation. We focus on the body connection of power-gated circuits, and examine the contribution of a power-gated circuit as a decoupling capacitance during the sleep mode. Experimental results show that the well junction capacitance of the power-gated circuit with body-tied structure helps reduce power supply noise while a sharp drop cannot be mitigated due to its large RC time constant.