• DocumentCode
    3193178
  • Title

    Elastic Timing Scheme for Energy-Efficient and Robust Performance

  • Author

    Samanta, Rupak ; Venkataraman, Ganesh ; Shah, Nimay ; Hu, Jiang

  • Author_Institution
    Texas A&M Univ., College Station
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    537
  • Lastpage
    542
  • Abstract
    In nanometer regime, IC designers are struggling between significant variation effects and tight power constraints. The conventional approach - using timing safety margin, consumes power continuously to guard against low probability timing variations. Such power inefficiency is largely eliminated in the Razor technology which detects and corrects variation induced timing errors at runtime. However, the error correction scheme of Razor causes pipeline stalling/flushing and therefore is not preferred in real-time systems or sequential circuits with feedback loops. We propose an elastic timing scheme which can correct timing errors without stalling/flushing pipeline. This is achieved by dynamically boosting circuit speed when timing error occurs. A dynamic clock skew shifting technique is suggested to reduce the boosting cost. An optimization algorithm is also provided to minimize the cost overhead. Compared to conventional safety margin based approach, the elastic timing scheme can reduce power dissipation by 20 % - 27 % on ISCAS89 sequential circuits while retaining similar variation tolerance. After optimization, the boosting is needed for only a small portion of entire circuit. As a result, the area overhead is usually less than 5 %.
  • Keywords
    clocks; error correction; logic design; optimisation; sequential circuits; ISCAS89 sequential circuits; dynamic boosting circuit; dynamic clock skew shifting; elastic timing scheme; energy-efficient performance; optimization algorithm; power constraints; robust performance; timing errors correction; variation effects; Boosting; Energy efficiency; Error correction; Pipelines; Real time systems; Robustness; Runtime; Safety; Sequential circuits; Timing; Boosting; Elstic; Pipeline; Razor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479792
  • Filename
    4479792