DocumentCode
3193178
Title
Elastic Timing Scheme for Energy-Efficient and Robust Performance
Author
Samanta, Rupak ; Venkataraman, Ganesh ; Shah, Nimay ; Hu, Jiang
Author_Institution
Texas A&M Univ., College Station
fYear
2008
fDate
17-19 March 2008
Firstpage
537
Lastpage
542
Abstract
In nanometer regime, IC designers are struggling between significant variation effects and tight power constraints. The conventional approach - using timing safety margin, consumes power continuously to guard against low probability timing variations. Such power inefficiency is largely eliminated in the Razor technology which detects and corrects variation induced timing errors at runtime. However, the error correction scheme of Razor causes pipeline stalling/flushing and therefore is not preferred in real-time systems or sequential circuits with feedback loops. We propose an elastic timing scheme which can correct timing errors without stalling/flushing pipeline. This is achieved by dynamically boosting circuit speed when timing error occurs. A dynamic clock skew shifting technique is suggested to reduce the boosting cost. An optimization algorithm is also provided to minimize the cost overhead. Compared to conventional safety margin based approach, the elastic timing scheme can reduce power dissipation by 20 % - 27 % on ISCAS89 sequential circuits while retaining similar variation tolerance. After optimization, the boosting is needed for only a small portion of entire circuit. As a result, the area overhead is usually less than 5 %.
Keywords
clocks; error correction; logic design; optimisation; sequential circuits; ISCAS89 sequential circuits; dynamic boosting circuit; dynamic clock skew shifting; elastic timing scheme; energy-efficient performance; optimization algorithm; power constraints; robust performance; timing errors correction; variation effects; Boosting; Energy efficiency; Error correction; Pipelines; Real time systems; Robustness; Runtime; Safety; Sequential circuits; Timing; Boosting; Elstic; Pipeline; Razor;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
978-0-7695-3117-5
Type
conf
DOI
10.1109/ISQED.2008.4479792
Filename
4479792
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