Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework

We present a method for establishing traceability of a commercial electronic calibration unit for vector network analyzers by characterizing the scattering parameters of its internal states with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Microwave Uncertainty Framework to propagate uncertainties. With the electronic calibration unit characterized, we use it to calibrate a network analyzer, and characterize a number of verification devices with corresponding uncertainties. We also characterize the same verification devices using one of the previous multiline TRL calibrations, and compare results.