Experiment and analysis of microwave termination stability over temperature and time

Author

Yeou-Song Lee

Author_Institution

Dept. of Quality Assurance, Anritsu Co., Morgan Hill, CA, USA

fYear

2012

fDate

22-22 June 2012

Firstpage

1

Lastpage

5

Abstract

A microwave termination is a single-port, 50 ohm device. We have developed experiments to determine the temperature stability on the VSWR performance of terminations. Measurements were made in a temperature and humidity chamber and by a vector network analyzer (VNA) outside the chamber. Accuracy of terminations will change with time. It is also desirable to understand the short-term stability and its implication towards the long-term drift. Empirical study shows a good agreement by using the modified linear regression technique.

Keywords

humidity measurement; microwave devices; microwave measurement; network analysers; regression analysis; stability; temperature measurement; time measurement; VNA; VSWR performance; humidity chamber measurement; long-term drift; microwave measurement; microwave termination stability; modified linear regression technique; resistance 50 ohm; short-term stability; single-port device; temperature measurement; temperature stability; vector network analyzer; Calibration; Microwave measurements; Performance evaluation; Stability analysis; Temperature; Temperature measurement; Thermal stability; coaxial termination; drift; linear regression; temperature variation;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference (ARFTG), 2012 79th ARFTG

Conference_Location

Montreal, QC

Print_ISBN

978-1-4673-1229-5

Electronic_ISBN

978-1-4673-1230-1

Type

conf

DOI

10.1109/ARFTG79.2012.6291187

Filename

6291187