• DocumentCode
    3193986
  • Title

    Noise temperature of an electronic tuner for noise parameter measurement systems

  • Author

    Axelsson, Olle ; Thorsell, Mattias ; Andersson, Kristoffer ; Stenarson, Jörgen ; Rolain, Yves

  • Author_Institution
    Microwave Electron. Lab., Chalmers Univ. of Technol., Göteborg, Sweden
  • fYear
    2012
  • fDate
    22-22 June 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, the noise temperature of an electronic tuner is determined and its significance for the suitability of such tuners in noise parameter measurement systems discussed. The noise temperature of the tuner was found to be higher than the ambient room temperature in the laboratory and vary significantly between tuner states. For impedance states with small input reflections coefficients, the excess noise temperature is around 25 K. For some of the states with higher reflection coefficients, this figure increases, reaching around 45 K at |Γ| = 0.75. Unless accounted for, this leads to errors in noise parameter extraction when using an electronic tuner in noise parameter measurements.
  • Keywords
    circuit tuning; electric noise measurement; temperature measurement; electronic tuner; noise parameter extraction; noise parameter measurement system; noise temperature; small input reflections coefficient; temperature 293 K to 298 K; Impedance; Measurement uncertainty; Noise; Noise measurement; Power measurement; Temperature measurement; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
  • Conference_Location
    Montreal, QC
  • Print_ISBN
    978-1-4673-1229-5
  • Electronic_ISBN
    978-1-4673-1230-1
  • Type

    conf

  • DOI
    10.1109/ARFTG79.2012.6291197
  • Filename
    6291197