DocumentCode
3196747
Title
Edge detection in electron microscopy biological images using statistical dispersion
Author
Bhadouria, Vivek Singh ; Ghoshal, Devarshi
fYear
2012
fDate
14-15 Dec. 2012
Firstpage
96
Lastpage
100
Abstract
During the last few decades, there has been a tremendous development in the field of biological sciences. With this, there is an increasing demand for analyzing the molecular or cellular features of the cell in the images, acquired with the electron microscopes (EM). However, despite significant progress in image processing, the efficient detection of features and edges in biological images is still a challenging task due to the presence of minute structures with low intensity variation, compared with the background. In this paper, a novel algorithm for edge detection in electron microscopy biological image is proposed. The edge detector is based on the statistical dispersion of D8 pixels followed by an edge thinning operation. The proposed algorithm has been compared with other state-of-art edge detectors viz. Sobel´s and Canny´s edge detectors and results suggest that the proposed scheme perform better in detecting the significant edges in Tobacco Mosaic Virus (TMV; scanning-transmission electron microscopy image) and Virus Like Particles (VLPs; transmission electron microscopy image); used as test images in the present study. Experimental results (in terms of Pratt´s figure of merit) also suggest that the proposed algorithm is more robust to noise when compared to Sobel´s or Canny´s edge detector. Consequently, the proposed algorithm can operate efficiently in a noisier environment, compared to Sobel´s or Canny´s edge detector.
Keywords
biology computing; edge detection; electron microscopy; feature extraction; statistical analysis; edge detection; edge thinning; electron microscopy biological images; feature detection; image processing; scanning-transmission electron microscopy image; statistical dispersion; tobacco mosaic virus; virus like particles; Bioinformatics; Biological system modeling; Equations; Image edge detection; Mathematical model; Edge detection; Electron microscopy image; Pratt´s figure of merit; Statistical dispersion;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Vision and Image Processing (MVIP), 2012 International Conference on
Conference_Location
Taipei
Print_ISBN
978-1-4673-2319-2
Type
conf
DOI
10.1109/MVIP.2012.6428769
Filename
6428769
Link To Document