DocumentCode
319728
Title
EMG pattern recognition based on evidence accumulation for prosthesis control
Author
Lee, Seok-pil ; Park, Sang-Hui ; Kim, Jeong-seop ; Kim, Ig-Jae
Author_Institution
Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea
Volume
4
fYear
1996
fDate
31 Oct-3 Nov 1996
Firstpage
1481
Abstract
The authors present an EMG pattern recognition method to identify motion command for the control of a prosthetic arm by evidence accumulation with multiple parameters. The adaptive cepstrum coefficients which the authors propose in this paper, integral absolute value (IAV), difference absolute mean value (DAMV), variance and autoregressive (AR) model coefficients, are extracted as parameters by probabilistic and stochastic models. Pattern recognition is carried out through an evidence accumulation procedure with the distances measured with reference parameters. A fuzzy mapping function is designed to transform the distances. A recognition comparison test is provided to show the superiority of the suggested recognition method. A separability comparison test is also provided to evaluate the feasibility of the adaptive cepstrum coefficients extracted by the proposed approach
Keywords
artificial limbs; biocontrol; electromyography; feature extraction; medical signal processing; parameter estimation; pattern recognition; EMG pattern recognition; adaptive cepstrum coefficients; autoregressive coefficients; difference absolute mean value; evidence accumulation; fuzzy mapping function; integral absolute value; motion command identification; multiple parameters; probabilistic models; prosthesis control; prosthetic arm; reference parameters; separability comparison test; stochastic models; variance; Biological system modeling; Cepstrum; Electromyography; Estimation error; Feature extraction; Pattern recognition; Prosthetics; Signal processing; Stochastic processes; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location
Amsterdam
Print_ISBN
0-7803-3811-1
Type
conf
DOI
10.1109/IEMBS.1996.647514
Filename
647514
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