• DocumentCode
    3198267
  • Title

    3D IC infrastructure status and issues

  • Author

    Vardaman, E. Jan

  • Author_Institution
    TechSearch Int., Inc., Austin, TX, USA
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Performance requirements such as increased bandwidth and lower power are driving the adoption of 3D ICs designed with through silicon vias. Many companies and research organizations have described the advantages of stacking chips vertically. There is no question that 3D TSV will be adopted, but the timing for mass production depends on how the cost of the new technology compares with that of existing technologies. As companies move from R&D into production the difficult work begins in addressing the issues of design, thermal management, test, and assembly. Different needs and economic factors determine the timing of adoption in each application. Issues in moving to volume production include the installation and qualification of high-volume 300 mm production lines, assembly and test capability, the availability of TSV interposers, and reliability data. This presentation provides an assessment of the infrastructure for 3D TSV and provides an update on the remaining barriers to adoption.
  • Keywords
    integrated circuit design; integrated circuit reliability; three-dimensional integrated circuits; 3D IC infrastructure status design; 3D TSV; TSV interposers; high-volume production lines; mass production; reliability data; size 300 mm; stacking chips; thermal management; through silicon vias; volume production; Copper; Silicon; TV; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5642907
  • Filename
    5642907