DocumentCode
3199292
Title
Parameterized Interconnect Modeling and Simulation in VLSI Design Considering Variations
Author
Liu, Chunchen ; Ruei-Xi Chen ; Huang, Huang ; Fan, Jeffrey
Author_Institution
Univ. of California at San Diego, La Jolla
fYear
2008
fDate
16-18 March 2008
Firstpage
225
Lastpage
229
Abstract
This paper proposed a new algorithm for modeling and simulation of interconnect circuit in nanometer very large scale integration (VLSI) design considering manufacturing process variations. The approach is based on the existing passive reduced-order interconnect macromodeling algorithm (PRIMA). By satisfying the constraints of PRIMA, both macromodel stability and passivity are preserved, so that overall circuit stability is guaranteed for active driver and passive load interconnect circuits. As a result, transfer function of interconnect circuit under the influence of process variation is obtained, where reduction matrix is calculated once only for different values of parameters describing characteristics of process variations. Experiments demonstrate that result from proposed parameterized PRIMA considering process variation is very close to that obtained from PRIMA, while execution time is much less (up to 512X faster).
Keywords
VLSI; circuit simulation; circuit stability; integrated circuit design; integrated circuit interconnections; matrix algebra; transfer functions; active driver; circuit stability; interconnect circuit simulation; macromodel stability; manufacturing process variations; nanometer very large scale integration design; parameterized interconnect modeling; passive load interconnect circuits; passive reduced-order interconnect macromodeling algorithm; reduction matrix; transfer function; Capacitance; Chip scale packaging; Circuit simulation; Circuit stability; Computational modeling; Delay; Equations; Integrated circuit interconnections; RLC circuits; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
System Theory, 2008. SSST 2008. 40th Southeastern Symposium on
Conference_Location
New Orleans, LA
ISSN
0094-2898
Print_ISBN
978-1-4244-1806-0
Electronic_ISBN
0094-2898
Type
conf
DOI
10.1109/SSST.2008.4480226
Filename
4480226
Link To Document