DocumentCode
3201150
Title
Development of amorphous silicon based p-i-n solar cell in a superstrate structure with p-microcrystalline silicon as window layer
Author
Rath, J.K. ; van der Werf, C.H.M. ; Rubinelli, F.A. ; Schropp, R.E.I.
Author_Institution
Dept. of Atomic & Interface Phys., Utrecht Univ., Netherlands
fYear
1996
fDate
13-17 May 1996
Firstpage
1101
Lastpage
1104
Abstract
Single junction p-i-n cells using a p-μc-Si:H layer as the window layer on top of SnO2:F coated glass have been fabricated. For the first time an efficiency of 9.63% could be achieved for a single junction cell with a truly microcrystalline p-layer in a superstrate configuration. This was possible because of the success in depositing thin (15 nm) p-μc-Si:H layer on top of SnO2:F coated glass deposited at low power (100 mW/cm2), moderate temperature (160°C) and conventional frequency (13.56 MHz). This has manifested in excellent blue spectral response and short circuit current. However, open circuit voltage and fill factor were critically dependent on the choice of buffer layer at the p/i interface. Computer simulations point out that this can be attributed to the large valence band offset between the amorphous i-layer and the microcrystalline p-layer. The buffer acts as a barrier to electron back diffusion and it reduces recombination in the p-layer. Tandem cells using both n-μc-Si:H and p-μc-Si:H in the tunnel junction showed an efficiency of 9.9% and FF of 0.73. The tunnel junction n-μc-Si:H/p-μc-Si:H needed an oxide interface layer for a good performance. The role of the interface layer may be to increase the tunnel recombination as well as to act as a diffusion barrier to dopants
Keywords
amorphous semiconductors; diffusion barriers; electron-hole recombination; elemental semiconductors; hydrogen; short-circuit currents; silicon; solar cells; valence bands; 13.56 MHz; 15 nm; 160 C; 9.63 percent; 9.9 percent; Si:H; SnO2:F; SnO2:F coated glass; amorphous silicon based p-i-n solar cell; blue spectral response; buffer layer; computer simulations; electron back diffusion barrier; fill factor; n-μc-Si:H; open circuit voltage; oxide interface layer; p-μc-Si:H window layer; p-microcrystalline silicon; p/i interface; recombination reduction; short circuit current; superstrate configuration; superstrate structure; tandem solar cells; thin p-μc-Si:H layer; tunnel junction; valence band offset; window layer; Amorphous silicon; Buffer layers; Frequency; Glass; PIN photodiodes; Photovoltaic cells; Short circuit currents; Temperature; Voltage; Windows;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location
Washington, DC
ISSN
0160-8371
Print_ISBN
0-7803-3166-4
Type
conf
DOI
10.1109/PVSC.1996.564323
Filename
564323
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