• DocumentCode
    3203272
  • Title

    High efficieny and long-term stability of nanocrystalline silicon based devices

  • Author

    Marconi, A. ; Anopchenko, A. ; Puker, G. ; Pavesi, L.

  • Author_Institution
    Dept. of Phys., Univ. of Trento, Povo, Italy
  • fYear
    2010
  • fDate
    1-3 Sept. 2010
  • Firstpage
    219
  • Lastpage
    221
  • Abstract
    High efficiency of silicon nanocrystal based devices is shown through energy-band gap engineering of the nanocrystal ensemble. By using bipolar tunneling, improved electrical and opto-electronic stabilities after long storage time and under aging experiments are demonstrated.
  • Keywords
    elemental semiconductors; energy gap; nanostructured materials; nanotechnology; semiconductor device reliability; silicon; storage; tunnelling; Si; bipolar tunneling; electrical stability; energy band gap engineering; long storage; long term stability; nanocrystal ensemble; nanocrystalline silicon based device; opto-electronic stabilities; Electroluminescence; Light emitting diodes; Nanocrystals; Nonhomogeneous media; Silicon; Temperature measurement; Voltage measurement; Band Gap Engineering; Device Stability; High Efficiency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2010 7th IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-6344-2
  • Type

    conf

  • DOI
    10.1109/GROUP4.2010.5643375
  • Filename
    5643375