• DocumentCode
    3203691
  • Title

    Multiple reaction analysis of cancer with different markers using silicon nanowire FET

  • Author

    Kuk Jin Jang ; Hyeyoun Kim ; Kook-Nyung Lee ; Min-Ho Lee

  • Author_Institution
    Med. IT Res. center, Korea Electron. Technol. Inst., Changwon, South Korea
  • fYear
    2013
  • fDate
    3-7 July 2013
  • Firstpage
    4506
  • Lastpage
    4509
  • Abstract
    In this study, we have used newly developed Silicon nanowire (SiNW) arrays to evaluate their feasibility for the quantification of different markers of interests. We have quantified four different markers of PSA, EGF, IL-6, and VDBP. Each marker showed measurements in the range of 0.184 ~ 17.79 ng/mL (PSA), 10 pg/mL ~ 10 ng/mL (EGF), 10 pg/mL ~ 50 ng/mL (IL-6), and 10 pg ~ 5 ng/mL (VDBP), respectively. For the experiment, we collected 10 different serum samples, 5 prostate cancer patients and 5 breast cancer patients, and measured and compared the resulting signal from the SiNW FET to serum sample from normal patients. As a result, we observed a meaningful pattern of markers associated with each type of cancer. In addition, we have measured the response signal of SiNWs conjugated with Epithelial cell adhesion molecules (EpCAM) markers against tumor cells as they interacted with those markers.
  • Keywords
    adhesion; biochemistry; biomechanics; biomedical electronics; biomedical materials; biomedical measurement; cancer; cellular biophysics; field effect transistors; gels; molecular biophysics; nanofabrication; nanomedicine; nanowires; proteins; sols; tumours; EGF marker; IL-6 marker; PSA marker; VDBP marker; breast cancer patient; cancer reaction analysis; epithelial cell adhesion molecule marker; field effect transistor; prostate cancer patient; serum sample; silicon nanowire FET array; tumor cell; Cancer; Multiplexing; Nanobioscience; Proteins; Semiconductor device measurement; Silicon; Tumors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
  • Conference_Location
    Osaka
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2013.6610548
  • Filename
    6610548