DocumentCode
3206416
Title
Eidothea open short test tool
Author
Choong, Steven Lim Yow ; Ping, Vivien Wong Wei
Author_Institution
Freescale Semicond. Malaysia Sdn. Bhd, Petaling Jaya
fYear
2007
fDate
25-28 Nov. 2007
Firstpage
1359
Lastpage
1362
Abstract
Henceforth, the Eidothea open short test tool was developed to perform open short tests on all pins at a considerably lower cost than the ATE. Eidothea supports up to 1024 channels and it is also a mobile test tool where engineers would be able to perform open short tests without the need to secure an ATE for this test.
Keywords
integrated circuit packaging; integrated circuit testing; Eidothea open short test tool; integrated circuit package; mobile test tool; power pins; Circuit testing; Diodes; Integrated circuit packaging; Integrated circuit testing; Performance evaluation; Pins; Power supplies; Protection; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent and Advanced Systems, 2007. ICIAS 2007. International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-1355-3
Electronic_ISBN
978-1-4244-1356-0
Type
conf
DOI
10.1109/ICIAS.2007.4658606
Filename
4658606
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