DocumentCode
3209306
Title
An Improved Path-Based Reliability Prediction Model for Component-Based Embedded Software
Author
Li, Changde ; Zhou, Xingshe ; Wang, Yuying ; Dong, Yunwei
Author_Institution
Sch. of Comput. Sci. & Eng., Northwestern Polytech. Univ., Xi´´an, China
fYear
2009
fDate
17-19 Dec. 2009
Firstpage
301
Lastpage
307
Abstract
With the increasing use of component-based software development in embedded systems, reliability prediction for such software has become a challenge. This paper consequently contributes to this problem through an improved path-based reliability prediction model. We use Hoare´s Communicating Sequential Processes (CSP) to specify the software architecture. So the execution path could be derived from CSP trace model accurately and completely. A probabilistic model named Component Transition Graph (CTG) is constructed. Based on CTG, the execution frequency of path is calculated. By analyzing the structure of loop in the architecture, we propose a solution for reliability estimation containing loops in path which is the most important contribution of our work. The reliability prediction and sensitivity analysis techniques and how the model could be used to identify the critical component interfaces and transition are illustrated with examples.
Keywords
communicating sequential processes; embedded systems; graph theory; object-oriented programming; probability; software architecture; software reliability; CSP; CSP trace model; Hoare communicating sequential processes; component transition graph; component-based embedded software; component-based software development; embedded systems; execution path frequency; path-based reliability prediction model; probabilistic model; reliability prediction; sensitivity analysis techniques; software architecture; Application software; Assembly; Computer architecture; Computer science; Embedded software; Embedded system; Predictive models; Programming; Sensitivity analysis; Software architecture; CSP; component; component transition graph; path-based model; reliability prediction;
fLanguage
English
Publisher
ieee
Conference_Titel
Frontier of Computer Science and Technology, 2009. FCST '09. Fourth International Conference on
Conference_Location
Shanghai
Print_ISBN
978-0-7695-3932-4
Electronic_ISBN
978-1-4244-5467-9
Type
conf
DOI
10.1109/FCST.2009.83
Filename
5392903
Link To Document