• DocumentCode
    3210193
  • Title

    Simulation and analysis of noise in switched capacitor amplifier circuits

  • Author

    Forbes, Leonard ; Gopalakrishnan, Harish ; Wanalertlak, Weetit

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR
  • fYear
    2005
  • fDate
    15-15 April 2005
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    Noise is an important factor in switched capacitor amplifiers. There is not a good understanding of device noise in switched capacitor circuits, the basic technique is to use large transistors and capacitance values such that kT/C noise dominates. Besides kT/C noise, however, both device or transistor thermal noise and 1/f noise are contributing factors. Techniques to simulate noise in switched capacitor circuits have only recently become available. These techniques have been applied here to a switched capacitor amplifier as is commonly employed in many analog CMOS circuits. A good comparison is obtained between simulations and analytical techniques. It is apparent that device thermal and l/f noise is an important consideration in switched capacitor circuits
  • Keywords
    1/f noise; amplifiers; circuit noise; switched capacitor networks; thermal noise; 1/f noise; device noise; kT/C noise; noise analysis; noise simulation; switched capacitor amplifier; thermal noise; 1f noise; Analytical models; Capacitance; Circuit noise; Circuit simulation; Noise level; Phase noise; Semiconductor device modeling; Switched capacitor circuits; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices, 2005. WMED '05. 2005 IEEE Workshop on
  • Conference_Location
    Boise, ID
  • Print_ISBN
    0-7803-9072-5
  • Type

    conf

  • DOI
    10.1109/WMED.2005.1431618
  • Filename
    1431618