• DocumentCode
    3211210
  • Title

    Evaluation of Surface Charge Density with Electrostatic Voltmeter - Measurement Geometry Considerations

  • Author

    Noras, Maciej A. ; Pandey, Apra

  • Author_Institution
    Dept. of Eng. Technol., Univ. of North Carolina at Charlotte, Charlotte, NC
  • fYear
    2008
  • fDate
    5-9 Oct. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Use and limitations of Kelvin probe based instruments for surface charge density measurements of dielectric materials are discussed. Three different devices are evaluated: a DC feedback electrostatic voltmeter (ESVM), an AC feedback ESVM and a fieldmeter. Special attention is paid to influence of geometry of the measured object. The effect of viewing angle of the probe, thickness of the sample as well as of stray capacitances are shown theoretically and verified experimentally.
  • Keywords
    density measurement; dielectric materials; surface charging; voltmeters; DC feedback; Kelvin probe; dielectric materials; electrostatic voltmeter; fieldmeter; measurement geometry; stray capacitances; surface charge density measurements; Charge measurement; Current measurement; Density measurement; Dielectric measurements; Electrostatic measurements; Feedback; Geometry; Kelvin; Probes; Voltmeters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
  • Conference_Location
    Edmonton, Alta.
  • ISSN
    0197-2618
  • Print_ISBN
    978-1-4244-2278-4
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/08IAS.2008.108
  • Filename
    4658896
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3211210