• DocumentCode
    3212045
  • Title

    Exact computation of maximally dominating faults and its application to n-detection tests

  • Author

    Polian, Ilia ; Pomeranz, Irith ; Becker, Bernd

  • Author_Institution
    Albert-Ludwigs-Univ., Freiburg, Germany
  • fYear
    2002
  • fDate
    18-20 Nov. 2002
  • Firstpage
    9
  • Lastpage
    14
  • Abstract
    n-detection test sets for stuck-at faults have been shown to be useful in detecting unmodeled defects. It was also shown that a set of faults, called maximally dominating faults, can play an important role in controlling the increase in the size of an n-detection test set as n is increased. In an earlier work, a superset of the maximally dominating fault set was used. In this work, we propose a method to determine exact sets of maximally dominating faults. We also define a new type of n-detection test sets based on the exact set of maximally dominating faults. We present experimental results to demonstrate the usefulness of this exact set in producing high-quality n-detection test sets.
  • Keywords
    Boolean functions; automatic test pattern generation; binary decision diagrams; fault diagnosis; logic testing; ATPG; BDD-based procedure; exact computation; exact set; fault dominance; formal techniques; high-quality test sets; maximally dominating faults; n-detection test sets; stuck-at faults; unmodeled defects; Application software; Boolean functions; Circuit faults; Circuit testing; Data structures; Electrical fault detection; Fault detection; Linear approximation; Size control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1825-7
  • Type

    conf

  • DOI
    10.1109/ATS.2002.1181677
  • Filename
    1181677