• DocumentCode
    3213356
  • Title

    CMOS floating gate defect detection using IDDQ test with DC power supply superposed by AC component

  • Author

    Michinishi, Hiroyuki ; Yokohira, Tokumi ; Okamoto, Takuji ; Kobayashi, Takehiko ; Hondo, Tsutomu

  • Author_Institution
    Fac. of Eng., Okayama Univ. of Sci., Japan
  • fYear
    2002
  • fDate
    18-20 Nov. 2002
  • Firstpage
    417
  • Lastpage
    422
  • Abstract
    In this paper, we propose a new IDDQ test method for detecting floating gate defects in CMOS ICs. In the method, an unusual increase of the supply current, caused by defects, is promoted by superposing an AC component on the DC power supply. The feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional IDDQ test.
  • Keywords
    CMOS logic circuits; electric current measurement; integrated circuit testing; logic testing; AC component superposed DC power supply; CMOS floating gate defect detection; CMOS logic IC; IDDQ tests; defect caused supply current increase; functional logic tests; CMOS logic circuits; Current supplies; Electronic equipment testing; Electronics industry; Gas detectors; Inverters; Logic testing; Power engineering and energy; Power supplies; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1825-7
  • Type

    conf

  • DOI
    10.1109/ATS.2002.1181747
  • Filename
    1181747
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3213356