Interconnect wire length estimation for stochastic wiring distributions

Author

Hefeida, Mohamed S. ; Chowdhury, Masud H.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA

fYear

2008

fDate

14-17 Dec. 2008

Firstpage

369

Lastpage

372

Abstract

This paper presents an improved stochastic wiring distribution model. The model is an improvement and modification of the models presented in some prior works available in literature. The proposed model shows 28% - 50% reduction in error when estimating the average interconnect wire length compared to existing models. This paper also investigates the effect of Rent´s exponent on the average wire length estimation. This investigation leads to the identification of some limitations of the approximations found in recent models.

Keywords

error analysis; integrated circuit interconnections; integrated circuit modelling; integrated logic circuits; stochastic processes; Rent exponent; error reduction; interconnect wire length estimation; interconnection networks; stochastic wiring distribution model; Computer errors; Costs; Helium; Integrated circuit interconnections; Logic gates; Microelectronics; Sockets; Stochastic processes; Wire; Wiring; Average wire length; Rent´s exponent; gate sockets; stochastic wiring distributions;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronics, 2008. ICM 2008. International Conference on

Conference_Location

Sharjah

Print_ISBN

978-1-4244-2369-9

Electronic_ISBN

978-1-4244-2370-5

Type

conf

DOI

10.1109/ICM.2008.5393767

Filename

5393767