DocumentCode
3220035
Title
Lead-free 0201 assembly and reliability
Author
Ramkumar, S. Manian ; Newasekar, Rahul ; Ghaffarian, Reza
Author_Institution
Center for Electron. Manuf. & Assembly, Rochester Inst. of Technol., NY, USA
fYear
2005
fDate
16-18 March 2005
Firstpage
94
Lastpage
99
Abstract
The many challenges with 0201 assembly can be attributed to the solder paste volume, pad design, aperture design, board finish, type of solder paste, pick and place and reflow profile. A design of experiment study was carried out to investigate the effects of these parameters on assembly defects and reliability. The test vehicles for the study consist of pad layouts for 2000-0201 components. Five different test vehicles were used, with the same pad layout and non-solder mask defined pads, with HASL, Ni/Au, pure tin (Sn), immersion silver (ImAg) and OSP finish. Four different pad shapes are designed on each of the test vehicles (rectangular, oval, modified home plate and double trapezoid). The pad areas for all four shapes are maintained the same. The pads are oriented both in the horizontal and vertical directions. Electroformed 3 mil and 4.65 mil thick stencils were used for printing the solder paste. The stencil was designed to obtain two distinct aperture-pad combinations (matched and unmatched). Three solder paste types (lead-based, lead-free and anti-tomstoning) were used in the study. Two test vehicles assembled for each experimental run, one with resistors and the other with capacitors, provided an understanding of the difference in the process for these two common passive devices. This paper discusses in detail the influence of a few key parameters and defects associated with them using both leaded and lead free solder alloys. The most recent data on shear test results after isothermal aging at 150°C are presented.
Keywords
assembling; design of experiments; reliability; solders; thermal properties; 150 C; aperture design; assembly defects; board finish; design of experiment; lead-free 0201 assembly; lead-free process; lead-free surface finish; modified apertures; pad design; solder alloys; solder paste type; solder paste volume; thermal aging; thermal cycle; Apertures; Assembly; Environmentally friendly manufacturing techniques; Gold; Lead; Shape; Silver; Testing; Tin; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
ISSN
1550-5723
Print_ISBN
0-7803-9085-7
Electronic_ISBN
1550-5723
Type
conf
DOI
10.1109/ISAPM.2005.1432055
Filename
1432055
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