DocumentCode
3220199
Title
Gun life improvement program
Author
Atkinson, John ; Grant, T. ; Stockwell, B. ; Levush, B. ; Nelson, E. ; Petillo, J. ; Eppley, K.
Author_Institution
Commun. & Power Industries, Palo Alto, CA, USA
fYear
2004
fDate
27-29 April 2004
Firstpage
326
Lastpage
327
Abstract
The presentation describes work done under a Navy contract to reduce the life cycle cost of an S-band coupled cavity device. End of life of these devices was determined to be caused primarily by cathode wear-out. Consequently, the thrust of the program has been to re-design the electron gun for longer life.
Keywords
CAD; cathodes; electrical engineering computing; electron guns; electron optics; life cycle costing; 3D code; MathCad model; S-band coupled cavity device; beam optics conformity; cathode loading; cathode wear-out; computer model; electron gun redesign; gun life improvement program; life cycle cost; operating temperature; shadow gridded gun; transient constraints; vacuum environment; Cathodes; Contracts; Costs; Geometrical optics; Laboratories; Magnetic analysis; Optical beams; Power industry; Shape; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2004. IVEC 2004. Fifth IEEE International
Print_ISBN
0-7803-8261-7
Type
conf
DOI
10.1109/IVELEC.2004.1316343
Filename
1316343
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