DocumentCode
322179
Title
Surfing the SAW: visualizing the oscillation of Au(111) surface atoms
Author
Hesjedal, T. ; Chilla, E. ; Frohlich, H.-J.
Author_Institution
Inst. for Solid-State Electron., Berlin, Germany
Volume
1
fYear
1997
fDate
5-8 Oct 1997
Firstpage
511
Abstract
In this paper we report the observation of surface acoustic waves using a scanning tunneling microscope (STM). As the STM control electronics have a bandwidth limit in the kHz range, SAWs at typical frequencies of MHz to GHz cause a loss of contrast which can be clearly seen on an atomic scale. In order to access the amplitude and phase of a SAW, we introduced a heterodyning type STM, the scanning acoustic tunneling microscope (SATM). Contrary to the STM technique, the SATM measures snapshots of the state of oscillation. On the nanometer scale, two contributions to the phase and amplitude contrast are discussed. First, the SAWs phase delay gives a mainly linear dependence on the distance of the source. Second, the atomic oscillation trajectories within the SAW lead to a signal contribution that is made up of the shape of the oscillation trajectory and the local topography. On an atomic scale where the influence of the phase delay on the contrast can be neglected the oscillation trajectories of single surface atoms are studied. Finally, the atomically resolved phase and amplitude images are compared to simulated data
Keywords
acoustic applications; acoustic microscopy; gold; scanning tunnelling microscopy; surface acoustic waves; surface phonons; surface topography; Au; Au(111); SATM; SAW; SAW amplitude; SAW phase; SAW phase delay; STM; amplitude contrast; atomic oscillation trajectories; atomic scale; atomically resolved amplitude image; atomically resolved phase image; contrast loss; heterodyning type STM; local topography; nanometer scale; phase contrast; scanning acoustic tunneling microscopy; scanning tunneling microscopy; signal contribution; source distance dependence; surface acoustic waves observation; surface atoms oscillation visualisation; Acoustic waves; Atomic measurements; Bandwidth; Delay; Frequency; Microscopy; Surface acoustic waves; Surface topography; Tunneling; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location
Toronto, Ont.
ISSN
1051-0117
Print_ISBN
0-7803-4153-8
Type
conf
DOI
10.1109/ULTSYM.1997.663073
Filename
663073
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