• DocumentCode
    3225250
  • Title

    A technique for estimating signal waveforms at inaccessible points in high speed digital circuits

  • Author

    Kinoshita, T. ; Hara, Satoshi ; Takahashi, Eisuke ; Uriu, Kazuhide

  • Author_Institution
    R&D Div., Panasonic Corp., Kadoma, Japan
  • fYear
    2013
  • fDate
    15-18 Dec. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    There is a large difference between the waveforms of high speed digital signals measured on a printed circuit board and those at the receiving terminals of LSI chips. In order to ensure that the high speed digital signal is correctly transferred, one of the major issues is how to estimate the waveform at the receiving terminal, where the waveform cannot be directly measured. Therefore, we have developed a new technique for estimating the waveform at the receiving terminal from the waveform measured at an accessible test point, based on the input impedance and transmission characteristics of the traces. By comparing the estimated waveform and the measured waveform in a Blu-ray Disc recorder system, it was confirmed that it is possible to estimate the waveform with high accuracy. Furthermore, it was confirmed that the estimated waveform has good correlation with the timing margin for correct data transfer.
  • Keywords
    high-speed integrated circuits; large scale integration; printed circuits; Blu-ray Disc recorder system; LSI chips; data transfer; high-speed digital circuits; high-speed digital signal; input impedance; printed circuit board; receiving terminal; receiving terminals; signal waveform estimation; timing margin; transmission characteristic; Accuracy; Jitter; Large scale integration; Noise; Radio frequency; Semiconductor device measurement; Timing; DDR3; LSI package; eye diagram; high speed digtal circuits; jitter; signal integrity; simulation; timing margin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/EMCCompo.2013.6735162
  • Filename
    6735162