• DocumentCode
    3228176
  • Title

    Etched facet semiconductor resonators fabricated by reactive ion beam etching for micro-photonic integrated circuits

  • Author

    Koyama, F. ; Matsutani, A. ; Iga, K.

  • Author_Institution
    Precision & Intell. Lab., Tokyo Inst. of Technol., Japan
  • Volume
    2
  • fYear
    1995
  • fDate
    30 Oct-2 Nov 1995
  • Firstpage
    114
  • Abstract
    Summary form only given. Monolithic integration of semiconductor photonic devices is one of key issues for future lightwave networks. Size reduction of photonic devices including semiconductor lasers is important for large scale integration. In this work, we have developed semiconductor micro-fabrication processes to realize miniature photonic devices such as micro-ring lasers and tiny corner reflectors. The design and the characterization on etched facet resonators fabricated by reactive ion beam etching (RIBE) will be presented. We use the total internal reflection at the interface between semiconductors and air to confine the lightwave in the miniature photonic devices. For this purpose, we have fabricated some etched facet resonators
  • Keywords
    etching; integrated optoelectronics; ion beam applications; laser cavity resonators; optical fabrication; ring lasers; semiconductor lasers; sputter etching; RIBE; etched facet resonators; etched facet semiconductor resonators fabrication; large scale integration; lightwave networks; micro-photonic integrated circuits; micro-ring lasers; miniature photonic devices; photonic devices; reactive ion beam etching; semiconductor lasers; semiconductor micro-fabrication processes; semiconductor photonic devices; size reduction; tiny corner reflectors; total internal reflection; Etching; Gallium arsenide; Ion beams; Lakes; Optical arrays; Optical materials; Reflectivity; Ring lasers; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2450-1
  • Type

    conf

  • DOI
    10.1109/LEOS.1995.484623
  • Filename
    484623