• DocumentCode
    3229550
  • Title

    Study of electrical breakdown voltage in a partially damaged glass insulators chain with polycarbonate protectors

  • Author

    Yanaguizawa, I.A. ; Leite, L.R.P. ; Shinohara, A.H. ; Xavier, G. J V ; Maciel, D.A.

  • Author_Institution
    Univ. Fed. de Pernambuco, Recife, Brazil
  • fYear
    2004
  • fDate
    8-11 Nov. 2004
  • Firstpage
    727
  • Lastpage
    730
  • Abstract
    In this work, the experimental results of high-voltage in industrial frequency and switching impulse tests conducted to evaluate the influence of polycarbonate protectors (polyprotect) on the values of electrical breakdown voltage of a glass insulators chain with 16 units partially damaged, containing 9 broken insulators, are presented simulating a transmission line of 230 kV. The polyprotect have been designed to protect the glass part against the damage due to the vandalism actions. For testing, the broken insulators have been distributed along the chain in two different configurations. Electrical breakdown voltage values were compared to the same configuration, but without polyprotect. As a result, higher value of the electrical breakdown voltage had been observed in a configuration with uniform distribution of the entire insulators along of the chain. However, no significant different values in the electrical breakdown voltage were observed.
  • Keywords
    electric breakdown; impulse testing; insulator testing; polymer insulators; power transmission lines; power transmission protection; 230 kV; electrical breakdown voltage; industrial frequency; partially damaged glass insulators chain; polycarbonate protectors; polyprotection; switching impulse tests; transmission line simulation; vandalism; Breakdown voltage; Contact resistance; Dielectrics and electrical insulation; Electric resistance; Frequency; Glass industry; Insulator testing; Protection; Thermal resistance; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exposition: Latin America, 2004 IEEE/PES
  • Print_ISBN
    0-7803-8775-9
  • Type

    conf

  • DOI
    10.1109/TDC.2004.1432470
  • Filename
    1432470