DocumentCode
3232825
Title
Design and simulation of logic circuits by combined single-electron/MOS Transistor Structures
Author
Li, Qin ; Cai, Li ; Zhou, Youjie ; Wu, Gang ; Wang, Sen
Author_Institution
Inst. of Sci., Air Force Eng. Univ., Xian
fYear
2008
fDate
6-9 Jan. 2008
Firstpage
210
Lastpage
214
Abstract
Based on both the I-V characteristics of single-electron transistors and the MOS digital integrated circuit design concept, a good combination of single-electron transistors with MOS transistors is advanced to create a novel inverter, which, compared with the pure SET circuit, is considerably augmented in its voltage gain and drive capability. Then a close analysis was conducted of the inverter, on the basis of which other logic gates were presented. These logic gates are applied to the half adder circuit and the odd-even checker. The accuracy of two circuits is verified through the test on SPICE. The simulated result shows that these hybrid circuits share the merits with both SET circuits and MOS circuits. Compared with the traditional circuits, the two combinational logic circuits use fewer electronic components and are lower in power dissipation.
Keywords
MOSFET; adders; combinational circuits; hybrid integrated circuits; logic design; logic gates; logic testing; single electron transistors; MOS transistor structures; MOS transistors; SET circuit; SPICE; combinational logic circuits; electronic components; half adder circuit; hybrid circuits; inverter; logic circuit design; logic circuit simulation; logic gates; odd-even checker; power dissipation; single-electron transistor structures; single-electron transistors; Adders; Circuit simulation; Circuit testing; Digital integrated circuits; Logic circuits; Logic gates; MOSFETs; Pulse inverters; Single electron transistors; Voltage; Half adder; Inverter; MOS; Odd-even checker; SPICE; Single Electron Transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location
Sanya
Print_ISBN
978-1-4244-1907-4
Electronic_ISBN
978-1-4244-1908-1
Type
conf
DOI
10.1109/NEMS.2008.4484320
Filename
4484320
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