• DocumentCode
    3232825
  • Title

    Design and simulation of logic circuits by combined single-electron/MOS Transistor Structures

  • Author

    Li, Qin ; Cai, Li ; Zhou, Youjie ; Wu, Gang ; Wang, Sen

  • Author_Institution
    Inst. of Sci., Air Force Eng. Univ., Xian
  • fYear
    2008
  • fDate
    6-9 Jan. 2008
  • Firstpage
    210
  • Lastpage
    214
  • Abstract
    Based on both the I-V characteristics of single-electron transistors and the MOS digital integrated circuit design concept, a good combination of single-electron transistors with MOS transistors is advanced to create a novel inverter, which, compared with the pure SET circuit, is considerably augmented in its voltage gain and drive capability. Then a close analysis was conducted of the inverter, on the basis of which other logic gates were presented. These logic gates are applied to the half adder circuit and the odd-even checker. The accuracy of two circuits is verified through the test on SPICE. The simulated result shows that these hybrid circuits share the merits with both SET circuits and MOS circuits. Compared with the traditional circuits, the two combinational logic circuits use fewer electronic components and are lower in power dissipation.
  • Keywords
    MOSFET; adders; combinational circuits; hybrid integrated circuits; logic design; logic gates; logic testing; single electron transistors; MOS transistor structures; MOS transistors; SET circuit; SPICE; combinational logic circuits; electronic components; half adder circuit; hybrid circuits; inverter; logic circuit design; logic circuit simulation; logic gates; odd-even checker; power dissipation; single-electron transistor structures; single-electron transistors; Adders; Circuit simulation; Circuit testing; Digital integrated circuits; Logic circuits; Logic gates; MOSFETs; Pulse inverters; Single electron transistors; Voltage; Half adder; Inverter; MOS; Odd-even checker; SPICE; Single Electron Transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1907-4
  • Electronic_ISBN
    978-1-4244-1908-1
  • Type

    conf

  • DOI
    10.1109/NEMS.2008.4484320
  • Filename
    4484320