An improved method of extracting permittivity combined SVM and waveguide theory

Author

Xiao, Huaibao ; Lu, Guizhen ; Zhang, Li ; Li, Xiaoru

Author_Institution

Commun. Univ. of China, Beijing, China

fYear

2010

fDate

8-11 May 2010

Firstpage

1185

Lastpage

1188

Abstract

A new method of determining permittivity by SVM is studied in this paper. The mapping relationship between the S parameters and the permittivity is set up by calculating a large number of S parameters from the samples with different permittivity using waveguide theory. The simulated data set is used as training data set for SVM. After being trained, the SVM is used to predict the permittivity of material from the scattering coefficients. The validity of the method is also verified using FEM.

Keywords

S-parameters; electrical engineering computing; finite element analysis; permittivity; support vector machines; waveguide theory; FEM; S parameters; Waveguide Theory; permittivity extraction; scattering coefficients; simulated data set; support vector machine; training data set; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic waveguides; Electronic equipment; Permeability; Permittivity measurement; Rectangular waveguides; Scattering parameters; Support vector machines; Waveguide theory;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-5705-2

Type

conf

DOI

10.1109/ICMMT.2010.5525030

Filename

5525030