DocumentCode
3234314
Title
Package size and epoxy mass effects on package hermeticity requirements
Author
Bjorndahl, William D.
Author_Institution
Electron. Syst. Group, TRW Inc., Redondo Beach, CA, USA
Volume
4
fYear
1997
fDate
1-8 Feb 1997
Firstpage
277
Abstract
Hermetic packages are required to protect sensitive electronic components from atmospheric constituents. The primary constituent of concern is water. Hermeticity requirements for large sealed assemblies are somewhat difficult to address because for normal leak rates, long bomb times are required in order to get enough helium into the package so that during leak rate measurement, a detectable concentration of helium comes out. Additionally, because many packaging houses seal in an atmosphere containing a significant partial pressure of helium, application of the current specification inadvertently requires larger packages to be more hermetic than smaller ones. Logically, small packages should have more stringent leak rate requirements than large packages, since for an equivalent leak rate the time to reach a given concentration of moisture in a larger package is longer. The trend in hermetically sealed assemblies has been to larger sizes. Examples include multi-chip modules (MCMs) and chip-on-board assemblies. This paper illustrates the inconsistencies which can occur when performing leak measurements on large packages. Also, the effect of gettering by moisture absorbing substances is evaluated both analytically and by examining residual gas analysis test results. It is found that moisture gettering by epoxies delays considerably the time for moisture build-up
Keywords
chemical variables measurement; environmental degradation; filled polymers; helium; integrated circuit packaging; leak detection; military equipment; moisture; multichip modules; packaging; seals (stoppers); He; atmospheric constituents; bomb times; chip-on-board assemblies; electronic components; epoxies; epoxy mass effects; gettering; helium; leak rates; military standards; moisture absorbing substances; multi-chip modules; package hermeticity; residual gas analysis; Assembly; Atmospheric measurements; Electronic components; Electronics packaging; Gettering; Helium; Moisture; Protection; Water; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 1997. Proceedings., IEEE
Conference_Location
Snowmass at Aspen, CO
Print_ISBN
0-7803-3741-7
Type
conf
DOI
10.1109/AERO.1997.577514
Filename
577514
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