DocumentCode

3234555

Title

Designing Testable Plas for both Offline Testing and Concurrent Error Detection

Author

Sharma, Rajiv ; Rajashekhara, T.N.

Author_Institution

Dept. of Electrical Engineering, The Watson School, SUNY, Binghamton, NY

fYear

1987

fDate

31896

Firstpage

8

Lastpage

8

Keywords

Programmable logic arrays; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE

Type

conf

DOI

10.1109/STIER.1987.716350

Filename

716350