• DocumentCode
    3234683
  • Title

    A Generalized Approach for Automatic Test Pattern Generation

  • Author

    Raina, Rajeah ; Rajashekhara, T.N.

  • Author_Institution
    Dept. of Electrical Engineering, The Watson School, SUNY, Binghamton, NY
  • fYear
    1987
  • fDate
    31896
  • Firstpage
    15
  • Lastpage
    15
  • Keywords
    Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Dictionaries; Libraries; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
  • Type

    conf

  • DOI
    10.1109/STIER.1987.716357
  • Filename
    716357
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3234683