• DocumentCode
    3234718
  • Title

    Fatigue and Creep in Solder Joints

  • Author

    Homa, Thomas R. ; Huebner, R. Terry

  • Author_Institution
    IBM Corporation, Endicott, NY
  • fYear
    1987
  • fDate
    31896
  • Firstpage
    17
  • Lastpage
    17
  • Keywords
    Capacitors; Creep; Data engineering; Design engineering; Fatigue; Life testing; Packaging; Soldering; Surface-mount technology; Vents;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
  • Type

    conf

  • DOI
    10.1109/STIER.1987.716359
  • Filename
    716359