Proceedings 16th International Conference on VLSI Design concurrently with the 2nd International Conference on Embedded Systems Design

fYear

2003

fDate

4-8 Jan. 2003

Abstract

The following topics are dealt with: analog and RF devices; physical design; FPGA; MOS technology; ATPG and DFT; VLSI processors; memory technology; verification and synthesis; security; low power technologies; test optimization; system-on-a-chip; coupling effects; power estimation and control; high-level synthesis; device testing; reconfigurable system software.

Keywords

CMOS integrated circuits; MOS integrated circuits; VLSI; analogue integrated circuits; automatic test pattern generation; design for testability; digital signal processing chips; embedded systems; field programmable gate arrays; formal verification; high level synthesis; integrated circuit design; integrated circuit testing; integrated memory circuits; low-power electronics; radiofrequency integrated circuits; system-on-chip; ATPG; DFT; FPGA; MOS technology; RF devices; VLSI design; VLSI processors; analog devices; coupling effects; device testing; high-level synthesis; low power technologies; memory technology; physical design; power control; power estimation; reconfigurable system software; security; system-on-a-chip; test optimization; verification; Analog integrated circuits; CMOS integrated circuits; Design for testability; Digital signal processors; Field programmable gate arrays; High-level synthesis; Integrated circuit design; Integrated circuit testing; MOS integrated circuits; Semiconductor memories; Very-large-scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 2003. Proceedings. 16th International Conference on

Conference_Location

New Delhi, India

ISSN

1063-9667

Print_ISBN

0-7695-1868-0

Type

conf

DOI

10.1109/ICVD.2003.1183099

Filename

1183099