Finite element analysis of microstrip line on ferroelectric (Ba-Sr)TiO/sub 3/ substrate

Author

Young Chul Sung ; Sanghoon Choi ; Sangwook Nam

Author_Institution

Dept. of Electron. Eng., Seoul Nat. Univ., South Korea

fYear

1995

fDate

16-20 May 1995

Firstpage

1261

Abstract

The characteristics of microstrip line on ferroelectric (Ba-Sr)TiO/sub 3/ substrate is analyzed. The static field analysis is performed iteratively to obtain the position-dependent dielectric constant in BST substrate with DC bias voltage. On the assumption of small AC field compared to DC field, the propagation constant and the characteristic impedance of the microstrip line on such a biased BST substrate is found by edge-based finite element method. The results can be used for the accurate design of various devices using BST such as dielectric phase shifter, voltage controlled resonators, etc.<>

Keywords

ferroelectric devices; finite element analysis; microstrip lines; permittivity; substrates; transmission line theory; BaSrTiO/sub 3/; biased BST substrate; characteristic impedance; edge-based FEM; ferroelectric substrate; finite element method; microstrip line; position-dependent dielectric constant; propagation constant; static field analysis; Binary search trees; Dielectric constant; Dielectric substrates; Ferroelectric materials; Finite element methods; Impedance; Microstrip; Performance analysis; Propagation constant; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1995., IEEE MTT-S International

Conference_Location

Orlando, FL, USA

ISSN

0149-645X

Print_ISBN

0-7803-2581-8

Type

conf

DOI

10.1109/MWSYM.1995.406200

Filename

406200