• DocumentCode
    3237638
  • Title

    The application of scanning acoustic microscopy to dielectric polymer composite material study

  • Author

    Maev, R.G. ; Maeva, E.Yu. ; Levin, V.M.

  • Author_Institution
    Center of Acoustic Microscopy, Acad. of Sci., Moscow, Russia
  • Volume
    2
  • fYear
    1996
  • fDate
    20-23 Oct 1996
  • Firstpage
    717
  • Abstract
    Acoustic microscopy is an effective method for visualization and quantitative analysis of physico-mechanical properties and microstructure of dielectric polymer blends and polymer composites. It allows one to use this method for investigating a wide variety of opaque materials and obtaining information about their inner structure as well as for optically transparent materials in which the contrast between different structures is practically absent. The methods of acoustic microscopy turns out to be very sensitive to any kind of inhomogeneties as well as various bulk defects: microcracks, pours, adhesion disturbance, exfoliation, inclusions, deviations from the given thickness off the layer in multilayered system and coating, technological deviations of sizes, orientation and grain distribution. In this work, the authors present experimental results investigation of two groups of objects. First is, polyethylene-polystyrene mixture films produced by different methods, where acoustic images clearly reveal the internal distribution of phases for each technological process. The second group is a multilayer dielectric structure, formed by different kinds of polymer, such as high density polyethylene, polyamide or ethylene vinyl alcohol, etc. In this case methods were used for nondestructive measurement of the thickness of multilayer polymer composite and adhesive layer and defect inspection
  • Keywords
    acoustic microscopy; dielectric measurement; nondestructive testing; polymer blends; polymer films; adhesive layer; bulk defects; defect inspection; dielectric polymer blends; inner structure; internal distribution; multilayer dielectric structure; nondestructive measurement; opaque materials; optically transparent materials; physico-mechanical properties; polyethylene-polystyrene mixture; polymer composites; scanning acoustic microscopy; Acoustic applications; Dielectric materials; Microscopy; Microstructure; Nonhomogeneous media; Optical films; Optical materials; Optical polymers; Optical sensors; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
  • Conference_Location
    Millbrae, CA
  • Print_ISBN
    0-7803-3580-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.1996.564576
  • Filename
    564576