• DocumentCode
    3238392
  • Title

    A Generalized Approach for Automatic Test Pattern Generation

  • Author

    Raina, Rajesh ; Rajashekhara, T.N.

  • Author_Institution
    Dept. of Electrical Engineering, Duke University, NC
  • fYear
    1987
  • fDate
    31896
  • Firstpage
    132
  • Lastpage
    138
  • Keywords
    Algorithm design and analysis; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Dictionaries; Libraries; Switches; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
  • Type

    conf

  • DOI
    10.1109/STIER.1987.716387
  • Filename
    716387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3238392