DocumentCode
3239519
Title
ETBR: Extended Truncated Balanced Realization Method for On-Chip Power Grid Network Analysis
Author
Li, Duo ; Tan, Sheldon X D ; McGaughy, Bruce
Author_Institution
Dept. of Electr. Eng., Univ. of California, Riverside, Riverside, CA
fYear
2008
fDate
10-14 March 2008
Firstpage
432
Lastpage
437
Abstract
In this paper, we present a novel simulation approach for power grid network analysis. The new approach, called ETBR for extended truncated balanced realization, is based on model order reduction techniques to reduce the before the simulation. Different from the (improved) extended Krylov subspace methods EKS/IEKS [15, 2], ETBR performs fast truncated balanced realization on response Grammian to reduce the original system with the similar computation costs of EKS. ETBR also avoids the adverse explicit moment representation of the input signals. Instead, it uses spectrum representation of input signals by fast Fourier transformation. As a result, ETBR is more flexible for different types of input sources and can better capture the high frequency contents than EKS, and this leads to more accurate results especially for fast changing input signals. Experimental results on a number of large networks (up to one million nodes) show that, given the same order of the reduced model, ETBR is indeed more accurate than the EKS method especially for input sources rich in high-frequency components. ETBR also shows similar computation costs of EKS and less memory consumption than EKS.
Keywords
fast Fourier transforms; matrix algebra; power grids; power system simulation; reduced order systems; ETBR; circuit matrix; extended truncated balanced realization method; fast Fourier transformation; on-chip power grid network analysis; response Grammian; spectrum representation; Circuit simulation; Computational efficiency; Computational modeling; Degradation; Frequency; Integrated circuit interconnections; Network-on-a-chip; Power grids; Taylor series; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484719
Filename
4484719
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