Implications of Technology Trends on System Dependability

CMOS has been the dominant integrated circuit (IC) technology for nearly four decades, following the trends predicted by Moore´s Law, and fueling the information and communication revolution. As chip geometries decrease and transistor densities increase, new types of faults - from manufacturing defects and operational transients to long- term wearout - need to be addressed. These faults and the resulting logic errors have been dealt with at both the low and high levels of the design. This talk deals with approaches for improving dependability at the system level.