• DocumentCode
    3241238
  • Title

    A Single-supply True Voltage Level Shifter

  • Author

    Garg, Rajesh ; Mallarapu, Gagandeep ; Khatri, Sunil P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    979
  • Lastpage
    984
  • Abstract
    When a signal traverses on-chip voltage domains, a level shifter is required. Inverters can handle a high to low voltage shift with minimal leakage. For a low to high voltage level translation, inverters tend to consume a large amount of leakage power, and hence special circuits have been proposed for this type of translation. This paper reports a novel single-supply "true" (in the sense that it can handle a low to high, or high to low voltage level conversion) voltage level shifter, which can handle low-to-high and high-to-low voltage translation. Such a requirement arises in many modern ICs or systems-on-chip (SoCs). The use of single supply voltage reduces circuit complexity by eliminating the need for routing both supply voltages. The proposed circuit was extensively simulated in a 90 nm technology using SPICE. Simulation results demonstrate that the level shifter is able to perform voltage level shifting with low leakage for both low to high, as well as high to low voltage level translation. We have validated the correct operation of the proposed level shifter under process and temperature variations as well.
  • Keywords
    SPICE; circuit simulation; power convertors; 90 nm technology; SPICE; circuit complexity; circuit simulation; high-to-low voltage translation; low-to-high voltage translation; single-supply true voltage level shifter; size 90 nm; Circuit simulation; Complexity theory; Inverters; Low voltage; Minimization; Power engineering and energy; Routing; SPICE; Temperature; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484808
  • Filename
    4484808