• DocumentCode
    3241508
  • Title

    EPIC: Ending Piracy of Integrated Circuits

  • Author

    Roy, J.A. ; Koushanfar, Farinaz ; Markov, Igor L.

  • Author_Institution
    Dept. of EECS, Univ. of Michigan, Ann Arbor, MI
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    1069
  • Lastpage
    1074
  • Abstract
    As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized excess production. While only recently studied, IC piracy has now become a major challenge for the electronics and defense industries. We propose a novel comprehensive technique to end piracy of integrated circuits (EPIC). It requires that every chip be activated with an external key, which can only be generated by the holder of IP rights, and cannot be duplicated. EPIC is based on (i) automatically-generated chip IDs, (ii) a novel combinational locking algorithm, and (Hi) innovative use of public-key cryptography. Our evaluation suggests that the overhead of EPIC on circuit delay and power is negligible, and the standard flows for verification and test do not require change. In fact, major required components have already been integrated into several chips in production. We also use formal methods to evaluate combinational locking and computational attacks. A comprehensive protocol analysis concludes that EPIC is surprisingly resistant to various piracy attempts.
  • Keywords
    foundries; industrial property; integrated circuit design; integrated circuit manufacture; public key cryptography; random number generation; combinational locking; excess production; integrated circuit piracy; mask theft; public-key cryptography; semiconductor manufacturing; Circuit testing; Contracts; Defense industry; Foundries; Industrial electronics; Intellectual property; Intrusion detection; Investments; Production; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484823
  • Filename
    4484823